ATLANTA, Dec. 5, 2011 /PRNewswire/ --Qcept Technologies Inc. today introduced its ChemetriQ Inspection Services (Q-Services) - a new offering that enables IC manufacturers and equipment vendors to engage with Qcept and begin implementing non-visual defect (NVD) inspection programs uniquely tailored to their needs prior to purchasing a Qcept ChemetriQ® NVD inspection system.
"We recognize that some manufacturers may not be in a position to fund new equipment purchases at this time, yet need our help in qualifying new processes or trouble-shooting yield issues that arise from NVDs," stated Robert Newcomb, executive vice president at Qcept Technologies. "In addition, we are finding that companies utilizing smaller wafers or non-wafer-shaped substrates that are not currently supported by our ChemetriQ systems are also turning to us for help in resolving process issues.Q-Services enables us to support these companies and bring the benefits of NVD inspection to a wider range of customers."
With Q-Services, customers send their substrates to Qcept, which provides an inspection scan with its patented scanning Surface Potential Difference Imaging (SPDI) sensor technology, and then conducts data analysis and reporting relative to the customer's experimental studies. Customers that can benefit from Q-Services include wafer and IC manufacturers, as well as process equipment suppliers. In addition, since Q-Services can be used for non-wafer-shaped substrates as well as sub-200-mm diameter wafers, non-CMOS device manufacturers can also engage with Qcept to explore potential NVD inspection applications for optimizing their manufacturing processes and yields.
Companies interested in Q-Services can contact Qcept at QServices@qceptech.com.
Note to media: A video on the opening of Qcept's new demo lab and worldwide customer support center in Fremont, Calif., where its Q-Services program will be implemented, is available for viewing at http://www.youtube.com/watch?v=GmmSbKioAO0
About Qcept Technologies Inc.:
Qcept Technologies delivers wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Qcept's ChemetriQ® platform is being adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. More information can be found at www.qceptech.com.
ChemetriQ is a registered trademark of Qcept Technologies Inc. All other trademarks are the property of their respective owners.
SOURCE Qcept Technologies Inc.
