On the trail of a cause for solar cell LID

Scientists in the United States used sophisticated imaging to delve deep into the structure of a silicon solar cell, revealing for the first time a distinct defect signature for light-induced degradation. Their technique could be used to better understand the mechanisms behind multiple various defects affecting the performance of silicon and other solar cell technologies.Light-induced degradation (LID) has long been a problem for the PV industry, slowly eroding solar module performance, adding up to significant performance loss over years in the field. Plenty of solutions have been suggested. ...

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