New SWIR line-scan camera for silicon PV quality control

France's New Imaging Technologies has launched a short-wave infrared line-by-line scanning camera for high-definition and high-performance silicon PV inspection systems. New Imaging Technologies (NIT), a subsidiary of French defense and aerospace infrared imaging specialist Lynred, has launched LiSaSWIR, a new high-speed short-wave infrared (SWIR) line-by-line scanning camera suitable for quality inspection of silicon wafers and solar PV panels. The LiSaSWIR has a resolution of 2048 x 1 pixel with 8µm pixel pitch, a frame rate of over 80kHz full frame and a read-out noise of 90e-. The spectral ...

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