New research sheds light on defect regions in perovskite solar films

A Chinese research group has demonstrated an electrical imaging technique using 3D tomographic conductive atomic force microscopy to investigate passivation strategies of perovskite films to improve stability and efficiency of perovskite solar cells.Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of perovskite film to be able to examine the effects of passivation treatments intended to improve perovskite solar cell performance. "The key novelty is the ...

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