DAS Solar unveils new method to identify hot-spots in TOPCon back-contact solar modules

The Chinese manufacturer said it developed a new circuit-model-based method to accurately detect hot-spot risks in TOPCon back-contact modules, overcoming limitations of the IEC 61215 approach caused by low shunt resistance. Validated through indoor and outdoor tests, the method predicts temperature rise under shading and reportedly enables faster, more accurate hot-spot risk assessment.A group of researchers from Chinese PV module maker DAS Solar has created a new methodology to detect hot spot risks in TOPCon solar cells and modules based on back-contact (BC) architecture. "We found that the ...

Den vollständigen Artikel lesen ...