The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction PV devices.U.S.-based inspection equipment manufacturer Brightspot Automation has launched Plus-Spot, a non-contact photoluminescence (PL) imaging tool to reveal defects, such as cell cracks, thin-film shunts in panels, and other non-uniformities. It is suitable for quality control in silicon, thin film, and III-V multijunction space cell manufacturing applications, supporting devices that range in ...Den vollständigen Artikel lesen ...
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