New research reveals that ultraviolet degradation in TOPCon solar cells is governed by interface-level physical mechanisms involving hydrogen dynamics, defect formation, and charge evolution. These processes are strongly influenced by the design of the silicon nitride/aluminum oxide passivation stack, which determines long-term device stability.Researchers at Yangzhou University in China have investigated ultraviolet-induced degradation (UVID) pathways in both passivated emitter and rear cell (PERC) and tunnel oxide passivated contact (TOPCon) solar cells and have concluded that this phenomenon ...Den vollständigen Artikel lesen ...
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